NANOMETRICS
Live / Registered — Registered (as of 09 Jul 2024)
What this means for you
Registered since 09 Jul 2024. The owner can stop confusingly similar uses in the classes it covers.
Record
- Serial number
- 97308047
- Registration number
- 7444130
- Mark type
- Stylized text
- Filed
- 11 Mar 2022
- Published for opposition
- 04 Apr 2023
- Registered
- 09 Jul 2024
- Attorney of record
- Heather J. Kliebenstein
Goods and services
- Class 007 — Machines and machine tools: Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; Optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components
- Class 009 — Scientific and electric apparatus: Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; downloadable software for the semiconductor industry, namely, downloadable software for identifying defects in semiconductor structures, downloadable software for identifying semiconductor fabrication process excursions, downloadable software for recording and reviewing defects in semiconductors structures, downloadable software for identifying root causes of defects in semiconductor structures, and downloadable software for controlling and monitoring semiconductor fabrication equipment; metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with embedded computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; optical inspection equipment for 2D and 3D inspection of semiconductor materials; metrology instruments for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometers
- Class 042 — Scientific and technological services: Providing temporary use on online, non-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogenous packaging, and other advanced packaging electronics technologies; providing online non-downloadable software for the semiconductor industry, namely, online non-downloadable software for identifying defects in semiconductor structures, online non-downloadable software for identifying semiconductor fabrication process excursions, online non-downloadable software for recording and reviewing defects in semiconductors structures, online non-downloadable software for identifying root causes of defects in semiconductor structures, and online non-downloadable software for controlling and monitoring semiconductor fabrication equipment
Owner
- Onto Innovation Inc., Wilmington, MA, US
- Onto Innovation Inc., Wilmington, MA, US
- Onto Innovation Inc., Wilmington, MA, US
Prosecution history
- 09 Jul 2024 — NOTICE OF REGISTRATION CONFIRMATION EMAILED
- 09 Jul 2024 — REGISTERED-PRINCIPAL REGISTER
- 31 May 2024 — NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED
- 31 May 2024 — ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED
- 29 May 2024 — STATEMENT OF USE PROCESSING COMPLETE
- 30 Apr 2024 — USE AMENDMENT FILED
- 28 May 2024 — CASE ASSIGNED TO INTENT TO USE PARALEGAL
- 30 Apr 2024 — TEAS STATEMENT OF USE RECEIVED
- 02 Dec 2023 — NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED
- 30 Nov 2023 — SOU EXTENSION 1 GRANTED
- 30 Nov 2023 — SOU EXTENSION 1 FILED
- 30 Nov 2023 — SOU TEAS EXTENSION RECEIVED
- 30 May 2023 — NOA E-MAILED - SOU REQUIRED FROM APPLICANT
- 04 Apr 2023 — OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
- 04 Apr 2023 — PUBLISHED FOR OPPOSITION