TEMIC

Live / Registered — Registered — Sections 8 & 15 accepted and acknowledged (as of 13 Mar 2026)

What this means for you

Registered since 31 Dec 2019. The owner can stop confusingly similar uses in the classes it covers.

Record

Serial number
87671293
Registration number
5950681
Mark type
Design + words
Filed
03 Nov 2017
Published for opposition
12 Feb 2019
Registered
31 Dec 2019
Attorney of record
Joe McKinney Muncy

Goods and services

  • Class 009 — Scientific and electric apparatus: Optical apparatus and instruments, namely, electron microscopes; Hardware, namely, electronic and optical apparatus for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples in particular for microscopic examination and quality control purposes; Electric and electronic apparatus and instruments, namely, for microscopic examination; Microscopes, electron microscopes and scanning electron microscopes; parts and fittings for all the aforesaid goods, namely, sample holders, lenses, lighting devices for microscopes; Scientific and laboratory research apparatus, teaching apparatus and simulators, namely, vacuum chambers with precision mechanical stages and electron optical lenses, control software, programs and software applications for the analysis of data generated by the electron-detectors of the microscopes, electron microscopes and scanning electron microscopes; Adapters for adapting a camera to a microscope; Electron microscopes; Scientific apparatus, namely, spectrometers and parts and fittings therefor; [ Mass spectrometers in the nature of scientific apparatus; Semiconductor objectives; ] Condensers for microscopes; Co-observation attachment in the nature of a lens, a detector, a specimen holder, an environmental temperature/humidity controller, an in-situ specimen manipulator, and a pretreatment device for microscope; Spectrometers, namely, X-Ray spectrometer for use in identifying and measuring elemental compositions of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples; Electronic and optical instruments for measuring surfaces; Calibration devices for calibrating the proper performance parameters of x-ray spectrometers used on electron microscopes, used to study the performance of various materials in the industrial and academic areas; Scientific Instruments, namely, optical microscopes, electron microscopes, spectrometers, chromatographs and automated medical assay apparatus for metrology measurement, microstructure imaging, composition analysis, chemical analysis, pathological examination and pathogens detection; Laboratory apparatus and instruments for measuring elemental compositions, namely, x-ray fluorescence spectrometers; Apparatus for preparing and introducing samples into x- ray fluorescence spectrometers; Computer application software for controlling x-ray fluorescence spectrometers and for analyzing spectrometric results, and replacement parts therefor; Optical apparatus and instruments for analyzing material, namely, electron probe micro analyzers, energy-dispersive X- ray fluorescence spectrometers, energy-dispersive X-ray spectrometers, X-ray fluorescence spectrometers; Detectors for analyzing material, namely, X-ray detectors not for medical use, electron dispersive detectors; Measuring or testing machines and instruments, namely, review systems for analyzing or measuring material, namely, wafer defect inspection instruments, pattern measuring instruments; [ Microscopy diffraction apparatus in the nature of lenses for microscopes; Diffraction apparatus for microscopy not for medical purposes; ] Containers for microscope slides; Precision instruments for manipulation and positioning of microscopic objects; [ Prisms; ] Laboratory equipment, namely, microscope slides; [ Microtomes; Betatrons; ] Bio-chips for research or scientific purposes; Electromagnetic coils; [ X-ray apparatus not for medical purposes; ] Scientific and technical apparatus, namely, optical Mirrors; Inspection mirrors; Electron tubes; Photoelectric sensors; Optical sensors; Power supplies; Power supplies for electron beam systems; Computer application software for metrology analysis, continues inspection, and series images storing, processing, analyzing and exporting for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples, in particular for microscopic examination and quality control purposes

Owner

Prosecution history

  • 13 Mar 2026 — NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - E-MAILED
  • 13 Mar 2026 — REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK.
  • 13 Mar 2026 — CASE ASSIGNED TO POST REGISTRATION PARALEGAL
  • 10 Dec 2025 — TEAS SECTION 8 & 15 RECEIVED
  • 31 Dec 2024 — COURTESY REMINDER - SEC. 8 (6-YR) E-MAILED
  • 28 Dec 2022 — TEAS CHANGE OF CORRESPONDENCE RECEIVED
  • 28 Dec 2022 — TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS
  • 28 Dec 2022 — ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED
  • 28 Dec 2022 — TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED
  • 23 Dec 2022 — TEAS CHANGE OF CORRESPONDENCE RECEIVED
  • 23 Dec 2022 — TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS
  • 23 Dec 2022 — ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED
  • 23 Dec 2022 — TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED
  • 31 Dec 2019 — REGISTERED-PRINCIPAL REGISTER
  • 26 Nov 2019 — NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED

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