Serial 86292516

Dead / Abandoned — Abandoned — no statement of use filed (as of 26 Sept 2016)

What this means for you

This application is over — abandoned 26 Sept 2016. The name may be available, but check before relying on it — rights can also come from actual use, not only from the register.

Record

Serial number
86292516
Mark type
Design / logo
Filed
27 May 2014
Published for opposition
30 Jun 2015
Abandoned
26 Sept 2016
Attorney of record
Holly M. Ford

Goods and services

  • Class 009 — Scientific and electric apparatus: Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely, electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron-beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for non-medical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments, namely, diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, microscope software that enhances the navigational and functional capability of microscopic, analytic, lithographic and spectroscopic components separately and in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and in integrated systems, namely, operating software for use in microscopic imaging, milling, deposition and analysis; image processing software
  • Class 037 — Building construction and repair services: Installation, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; installation, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes in the nature of liquid-metal ion sources, and plasma sources; installation, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and instruments for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; installation, maintenance and repair of electron-beam lithography apparatus; installation, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; installation, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; installation, maintenance and repair of lasers for non-medical purposes; installation, maintenance and repair of optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; installation, maintenance and repair of diaphragms for scientific apparatus; installation, maintenance and repair of measuring instruments, namely, micrometer gauges; installation, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, and cathodoluminiscence detectors; installation, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges
  • Class 041 — Education and entertainment services: Arranging and conducting conferences, colloquiums, congresses, courses, seminars, symposiums, and workshops all for training purposes in the field of microscopy and nanotechnology, specifically in the subject areas of scanning and transmission electron microscopy, ion beam microscopy, ion beam processing techniques, and complex methods combining the forgoing microscopy with Raman microscopy, atomic force microscopy and lasers, and holographic microscopy

Owner

Prosecution history

  • 26 Sept 2016 — ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED
  • 26 Sept 2016 — ABANDONMENT - NO USE STATEMENT FILED
  • 25 Feb 2016 — NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED
  • 23 Feb 2016 — SOU EXTENSION 1 GRANTED
  • 23 Feb 2016 — SOU EXTENSION 1 FILED
  • 23 Feb 2016 — SOU TEAS EXTENSION RECEIVED
  • 25 Aug 2015 — NOA E-MAILED - SOU REQUIRED FROM APPLICANT
  • 30 Jun 2015 — OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
  • 30 Jun 2015 — PUBLISHED FOR OPPOSITION
  • 10 Jun 2015 — NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
  • 28 Apr 2015 — WITHDRAWN FROM PUB - OG REVIEW QUERY
  • 10 Apr 2015 — LAW OFFICE PUBLICATION REVIEW COMPLETED
  • 09 Apr 2015 — APPROVED FOR PUB - PRINCIPAL REGISTER
  • 09 Apr 2015 — EXAMINER'S AMENDMENT ENTERED
  • 09 Apr 2015 — NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED

View this trademark record on Marksy