REVONTIUM

What this means for you

Not registered yet, but its 27 Aug 2024 filing date beats anything filed after it. If it registers, the owner can stop confusingly similar uses in the classes it covers.

Record

Serial number

79418464

Mark type

Stylized text

Filed

27 Aug 2024

Attorney of record

Matthew A. Homyk

Goods and services

• Class 009 — Scientific and electric apparatus: Scientific apparatus and instruments, namely, X-ray fluorescence (XRF) spectrometers for measuring the elemental composition of materials, other than for medical purposes; scientific instruments, namely, X-ray fluorescence (XRF) spectrometers for detecting the elemental composition of materials, other than for medical purposes; Scientific apparatus and instruments, namely, spectrometers for laboratory use, X-ray fluorescence analysers, x-ray spectrometers for laboratory use; Scientific apparatus and instruments, namely, diffractometers for measuring and detecting the diffraction of waves including X-rays; Scientific apparatus and instruments, namely. X-ray diffractometers for measuring and detecting crystal structure, crystallinity, microstructural properties and crystalline phase identification; Scientific apparatus and instruments, namely, neutron activation analysers for analysing the elemental composition of a material including trace elements; Scientific apparatus and instruments, namely, pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; X-ray fluorescence analysers; X-ray spectrometers for laboratory use; X-ray detecting apparatus and instruments, namely, X-ray fluorescence (XRF) analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray fluorescence (XRF) analyzers not for medical purposes; spectrometers for laboratory use; Electronic spectrophotometers for use in identifying and measuring colours; apparatus for mass spectrometry; X-ray photo electron spectroscopy analysers, not for medical use; apparatus for analyzing gaseous, liquid, and solid elements, namely, neutron activation analysers, pulsed fast and thermal neutron activation analysers, and X-ray diffractometers; X-ray neutron activation analysers for analysing the elemental composition of a material including trace elements; X-ray pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; Inductively coupled plasma spectroscopy apparatus and instruments, namely, instruments for the elemental analysis of samples by Optical Emission Spectrometry and Mass Spectrometry; X-ray analytical apparatus, namely, X-ray fluorescence analyzers; industrial X-ray apparatus not for medical use; Spectrometers, other than for medical purposes, namely, X-ray microdiffractometers; Spectrometers, other than for medical purposes, namely, X-ray microdiffractometers; diffraction apparatus and instruments, namely, X-ray diffractometers; Spectrometers for laboratory use, namely, diffractometers; X-ray diffraction apparatus, namely, X-ray diffractometers, X-ray spectrometers for laboratory use, namely, x-ray diffractometers; X-ray fluorescence spectrometers, namely, x-ray fluorescence diffractometers for laboratory use; X-ray diffractometers; Semiconductor wafer analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects of semiconductor wafers; X-ray imaging detectors, namely, instruments used to capture the X-ray photons that pass through an object and convert them into an image; X-ray diffraction instruments, namely X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects of semi-conductor wafers and discs; automated spectroscopes, namely, ellipsometers; X-ray fluorescence wafer and disc analysers for analysing film thickness, composition and density of semi-conductor wafers and discs for the silicon semiconductor industry; Automated spectroscopes, namely, ellipsometers for the silicon semiconductor industry; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray Fluorescence (XRF) Spectrometers, X-ray Diffractometers (XRD), and X-ray Spectrometers for laboratory use; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray fluorescence spectrometers, x-ray tubes, other than for medical purposes; photon counting X-ray detectors, namely, direct conversion detectors that measure the energy and position of every individual X-ray photon that hits it; X-ray tubes, not for medical purposes; analytical, process control and measuring apparatus, namely, spectrometers for laboratory use, X-ray fluorescence analysers; analytical, process control and measuring apparatus, including spectrometers for laboratory use, X-ray fluorescence analysers for cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industries; analytical, process control and measuring apparatus, including spectrometers for laboratory use, x-ray fluorescence analysers for research and development institutions; metrology tools, namely, spectrometers for laboratory use, X-ray fluorescence analysers; Downloadable computer software for controlling and operating measuring instruments and for processing and analyzing data in the field of materials characterization; Downloadable computer software for analysing the elemental composition of a material including trace elements, crystal structure, crystallinity, microstructural properties and crystalline phase identification; Downloadable computer software for determining chemical composition of materials in the field of spectrometry; downloadable computer software for [specify the function of the software in relation to spectrometry] in the field of spectrometry; Recorded computer software for [specify the function of the software in relation to spectrometry] in the field of spectrometry; downloadable computer software for [specify the function of the software operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry;; Recorded computer software for operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry; Downloadable computer software for operating x-ray diffractometers and reviewing and analyzing data in the field of x-ray diffraction; Computer hardware relating to X-ray diffraction and X-ray diffraction apparatus; Downloadable computer software for operating x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Recorded computer software for operating x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Downloadable computer software for determining X-ray intensities; Recorded computer software for determining X-ray intensities; Downloadable computer software for operating and controlling x-ray apparatuses in the field of X-ray apparatuses; Downloadable computer software for performing X-ray diffraction analysis; Recorded computer software for performing x-ray diffraction analysis; Downloadable computer software for determining the thickness of semiconductor wafer layer samples; Recorded computer software for determining the thickness of semiconductor wafer layer samples; Downloadable computer software for determining chemical compositions; Recorded computer software for determining chemical compositions; Downloadable computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Recorded computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement
• Class 037 — Building construction and repair services: installation, maintenance and repair of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; installation of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; information, advisory and consultancy services all relating to the aforesaid
• Class 042 — Scientific and technological services: Scientific and technological services, namely, scientific research in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; scientific services, namely, research and design in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; design and development of scientific and measuring apparatus and instruments, namely, X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; Industrial research services in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; Scientific services, namely, scientific analysis in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; analysis of materials, namely, metals, metal alloys, ceramics, minerals, and cement; Scientific laboratory services for analytical testing of semiconductor wafers, solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Technological consulting services in the field of spectrometry and diffractometry; technological consulting services in the field of inductively coupled plasma spectroscopy; industrial analysis and research services in the field of spectrometry, diffractometry and inductively coupled plasma spectroscopy; design and development of X-ray apparatus, X-ray fluorescence analysers and spectrometers, X-ray analytical apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, inductively coupled plasma spectroscopy apparatus and instruments; design and development of computer hardware and software; design and development of computer software; Programming of computer software for others; design and development of computer software in the field of spectrometry, diffractometry and inductively coupled plasma spectroscopy; Programming of computer software for others in the field of spectrometry, diffractometry and inductively coupled plasmas spectroscopy; leasing and rental of scientific and measuring apparatus and instruments; leasing and rental of scientific and measuring apparatus, namely X-ray fluorescence analysers and spectrometers, elemental spectrometry apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, namely, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes

Owner

• Malvern Panalytical B.V., NL

Prosecution history

• 18 Feb 2026 — NOTIFICATION FOR REQ FOR RECON DENIED NO APPEAL FILED
• 18 Feb 2026 — ACTION FOR REQ FOR RECON DENIED NO APPEAL FILED E-MAILED
• 18 Feb 2026 — ACTION REQ FOR RECON DENIED NO APPEAL FILED COUNTED NOT MAILED
• 26 Jan 2026 — TEAS/EMAIL CORRESPONDENCE ENTERED
• 26 Jan 2026 — CORRESPONDENCE RECEIVED IN LAW OFFICE
• 26 Jan 2026 — TEAS REQUEST FOR RECONSIDERATION RECEIVED
• 25 Nov 2025 — NOTIFICATION OF FINAL REFUSAL EMAILED
• 25 Nov 2025 — FINAL REFUSAL E-MAILED
• 25 Nov 2025 — FINAL REFUSAL WRITTEN
• 27 Oct 2025 — TEAS/EMAIL CORRESPONDENCE ENTERED
• 27 Oct 2025 — CORRESPONDENCE RECEIVED IN LAW OFFICE
• 27 Oct 2025 — TEAS RESPONSE TO OFFICE ACTION RECEIVED
• 02 Sept 2025 — TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS
• 02 Sept 2025 — ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED
• 02 Sept 2025 — TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED