UNITY SEMICONDUCTOR
Dead / Abandoned — Abandoned — failure to respond (as of 26 Jun 2025)
What this means for you
This application is over — abandoned 06 Mar 2025. The name may be available, but check before relying on it — rights can also come from actual use, not only from the register.
Record
- Serial number
- 79379311
- Mark type
- Stylized text
- Filed
- 10 Aug 2023
- Abandoned
- 06 Mar 2025
- Attorney of record
- Jeffrey Goehring
Goods and services
- Class 009 — Scientific and electric apparatus: Inspection devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization; optical inspection systems, devices and sensors, namely, industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices for imaging, dark field and scattering detection, deflectometry, and fluorescence detection; metrology and dimensional control devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography imaging devices; optical metrology sensors, devices and systems, namely, sensors, devices, and systems comprised of camera, laser, light source, translation and rotation stage, robots, computer, display screen, and frames
- Class 037 — Building construction and repair services: Installation, maintenance and repair of machines, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization
- Class 042 — Scientific and technological services: Engineering services in the field of semiconductor, micro-optics, and micro-electromechanical systems inspection and metrology
Owner
- UNITY-SC, FR
Prosecution history
- 26 Jun 2025 — ABANDONMENT NOTICE E-MAILED - FAILURE TO RESPOND
- 26 Jun 2025 — ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE
- 08 Mar 2025 — NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB
- 20 Feb 2025 — NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB
- 20 Feb 2025 — NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB
- 12 Dec 2024 — NOTIFICATION FOR REQ FOR RECON DENIED NO APPEAL FILED
- 12 Dec 2024 — ACTION FOR REQ FOR RECON DENIED NO APPEAL FILED E-MAILED
- 12 Dec 2024 — ACTION REQ FOR RECON DENIED NO APPEAL FILED COUNTED NOT MAILED
- 24 Sept 2024 — TEAS/EMAIL CORRESPONDENCE ENTERED
- 23 Sept 2024 — CORRESPONDENCE RECEIVED IN LAW OFFICE
- 23 Sept 2024 — TEAS REQUEST FOR RECONSIDERATION RECEIVED
- 05 Sept 2024 — NOTIFICATION OF FINAL REFUSAL EMAILED
- 05 Sept 2024 — FINAL REFUSAL E-MAILED
- 05 Sept 2024 — FINAL REFUSAL WRITTEN
- 17 Jul 2024 — TEAS/EMAIL CORRESPONDENCE ENTERED