N NANOTOOLS

Live / Registered — Registered — Section 71 accepted (as of 13 Jul 2018)

What this means for you

Registered since 29 Jul 2008. The owner can stop confusingly similar uses in the classes it covers.

Record

Serial number
79026060
Registration number
3476734
Mark type
Design + words
Filed
17 Jun 2005
Published for opposition
13 May 2008
Registered
29 Jul 2008
Attorney of record
James M. Bagarazzi

Goods and services

  • Class 009 — Scientific and electric apparatus: Scientific apparatus and instruments, namely scanning probes for use in scanning probe microscopes for detecting structures on the submicron scale by mechanically contacting said structures
  • Class 040 — Treatment of materials: [ Material processing, namely, using semiconductor processing methods for the coating of carrier materials, namely, silicon, carbon, silicon oxide, silicon nitride, or silicon carbide in the preparation of probes for scanning microscopes; custom production of prods for probe devices for microscopes that use additive and/or subtractive, chemical and/or mechanical and/or electronic methods; materials processing of probe devices, namely, scanning probes for microscopes by coating, using mechanical or electronic or chemical methods; treatment of materials, namely, silicon, carbon, silicon oxide, silicon nitride, or silicon carbide, by coating, etching, metallizing, annealing, oxidizing or laser treatment; coating silicon, carbon, silicon oxide, silicon nitride, or silicon carbide with metals, insulators, semiconductors or organic chemicals for the purpose of producing conductive probes, insulating probes or semi-conducting probes for scanning microscopes ; etching of surfaces, namely, silicon, carbon, silicon oxide, silicon nitride, or silicon carbide by using wet chemical, dry chemical or mechanical or electronic methods. ]
  • Class 042 — Scientific and technological services: [ Scientific and industrial research, namely, in the area of mesoscopic technology; development of calibrations standards; using scanning electron microscopes and atomic force microscopes to analyze surfaces and present visual representations of the surfaces so analyzed; scientific investigations, scientific analyses, scientific recordings, and scientific evaluations, namely, using scanning electron microscopes and atomic force microscopes, in the field of microtechnology or nanotechnology. ]

Owner

Prosecution history

  • 19 Jun 2025 — INTERNATIONAL REGISTRATION RENEWED
  • 04 Feb 2022 — CHANGE OF NAME/ADDRESS REC'D FROM IB
  • 08 Jan 2022 — NEW REPRESENTATIVE AT IB RECEIVED
  • 19 Apr 2019 — PARTIAL INVALIDATION PROCESSED BY THE IB
  • 20 Mar 2019 — PARTIAL INVALIDATION OF REG EXT PROTECTION SENT TO IB
  • 20 Mar 2019 — INVALIDATION PROCESSED
  • 13 Mar 2019 — PARTIAL INVALIDATION OF REG EXT PROTECTION CREATED
  • 13 Jul 2018 — NOTICE OF ACCEPTANCE OF SEC. 71 - E-MAILED
  • 13 Jul 2018 — NOTICE OF ACCEPTANCE OF SEC. 71 - MAILED
  • 13 Jul 2018 — ASSIGNED TO PARALEGAL
  • 13 Jul 2018 — REGISTERED-SEC.71 ACCEPTED
  • 11 Jul 2018 — TEAS SECTION 71 RECEIVED
  • 14 Aug 2015 — PARTIAL INVALIDATION PROCESSED BY THE IB
  • 24 Jul 2015 — PARTIAL INVALIDATION OF REG EXT PROTECTION SENT TO IB
  • 24 Jul 2015 — INVALIDATION PROCESSED

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